Score reliability : contemporary thinking on reliability issues /
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Format: | Book |
Language: | English |
Published: | Thousand Oaks, Calif. : SAGE Publications, [2003], ©2003. |
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Table of Contents:
- Pt. I. Basic concepts in score reliability
- Understanding reliability and coefficient alpha, really / Bruce Thmpson
- Correcting effect sizes for score reliability: a reminder that measurement and substantive issues are linked inextricably / Frank Baugh
- Brief introduction to generalizability theory / Bruce Thompson
- Reliability methods: a note on the frequency of use of various types / Thomas P. Hogan, Amy Benjamin, Kristen L. Brezinski
- Confidence intervals about score reliability coefficients / Xitao Fan, Bruce Thompson
- Pt. II. Nature of reliability
- Guidelines for authors reporting score reliability estimates / Bruce Thompson
- Reliability as psychometrics versus datametrics / Shlomo S. Sawilowsky
- Psychometrics is datametrics: the test is not reliable / Bruce Thompson, Tammi Vacha-Haase
- Reliability: rejoinder to Thompson and Vacha-Haase / Shlomo S. Sawilowsky
- Pt. III. Reliability induction and reporting practices
- Sample compositions and variabilities in published studies versus those in test manuals: validity of score reliability inductions / Tammi Vacha-Haase, Lori R. Kogan, Bruce Thompson
- How well do researchers report their measures? An evaluation of measurement in published educational research / Dale Whittington
- Degree of congruence between test standards and test documentation within journal publications / Audrey L. Qualls, Angela D. Moss
- Pt. IV. Reliability generalization
- Reliability generalization: exploring variance in measurement error affecting score reliability across studies / Tammi Vacha-Haase
- Assessing the reliability of Beck Depression Inventory scores: reliability generalization across studies / Ping Yin, Xitao Fan
- Measurement error in "big five factors" personality assessment: reliability generalization across studies and measures / Chockalingam Viswesvaran, Deniz S. Ones
- Reliability generalization of the NEO personality scales / John C. Caruso.